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US Patent Issued on July 14 for "Planarity control for load pull tuner on wafer" (Canadian Inventor)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,079, issued on July 14. "Planarity control for load pull tuner on wafer" was invented by Christos Tsironis (Kirkland, Canada). According t... Read More


US Patent Issued to BATTELLE MEMORIAL INSTITUTE on July 14 for "System and method for rapid inspection of printed circuit board using multiple modalities" (Ohio Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,080, issued on July 14, was assigned to BATTELLE MEMORIAL INSTITUTE (Columbus, Ohio). "System and method for rapid inspection of printed ci... Read More


US Patent Issued to SAMSUNG ELECTRONICS on July 14 for "Jitter measuring circuit, jitter analyzing apparatus including the same, and related methods of manufacturing semiconductor devices" (South Korean Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,081, issued on July 14, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Jitter measuring circuit, jitter analyzing a... Read More


US Patent Issued to Infineon Technologies on July 14 for "Electronic device" (German, Austrian Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,082, issued on July 14, was assigned to Infineon Technologies AG (Neubiberg, Germany). "Electronic device" was invented by Wei Wang (Munich... Read More


US Patent Issued to Marvell Asia on July 14 for "System and method for schedule-based I/O multiplexing for integrated circuit (IC) scan test" (California Inventor)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,084, issued on July 14, was assigned to Marvell Asia Pte Ltd (Singapore). "System and method for schedule-based I/O multiplexing for integr... Read More


US Patent Issued to Intel on July 14 for "Infield periodic device testing while maintaining host connectivity" (American, Indian Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,085, issued on July 14, was assigned to Intel Corp. (Santa Clara, Calif.). "Infield periodic device testing while maintaining host connecti... Read More


US Patent Issued to Novocure on July 14 for "Temperature independent method and system for applying TTFields" (Connecticut Inventor)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,086, issued on July 14, was assigned to Novocure GmbH (Baar, Switzerland). "Temperature independent method and system for applying TTFields... Read More


US Patent Issued to BYD on July 14 for "Sampling apparatus, battery management system, and vehicle" (Chinese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,087, issued on July 14, was assigned to BYD Co. Ltd. (Shenzhen, China). "Sampling apparatus, battery management system, and vehicle" was in... Read More


US Patent Issued to CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) on July 14 for "Sampling component, battery, electric apparatus, manufacturing method of sampling component, and sampling method" (Chinese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,088, issued on July 14, was assigned to CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) Ltd. (Hong Kong). "Sampling component, battery, electri... Read More


US Patent Issued to VEHICLE ENERGY JAPAN on July 14 for "Battery control apparatus" (Japanese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,089, issued on July 14, was assigned to VEHICLE ENERGY JAPAN INC. (Hitachinaka, Japan). "Battery control apparatus" was invented by Kohei H... Read More